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- 512 stránok
- 18 hodin čítania
Viac o knihe
A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.
Nákup knihy
Foundations of Measurement Volume II, Amos Tversky, David H. Krantz, R. Duncan Luce, Patrick Suppes
- Jazyk
- Rok vydania
- 2006
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- Titul
- Foundations of Measurement Volume II
- Podtitul
- Geometrical, Threshold, and Probabilistic Representations
- Jazyk
- anglicky
- Vydavateľ
- Dover Publications
- Rok vydania
- 2006
- Väzba
- mäkká
- Počet strán
- 512
- ISBN10
- 0486453154
- ISBN13
- 9780486453156
- Série
- Základy merania
- Štítky
- Náučná literatúra, Spoločenské vedy, Technológie & Priemysel, Veda & Matematika, Filozofia, Psychológia, Veda, Matematika, Technológia
- Hodnotenie
- 3,35 z 5
- Anotácia
- A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.