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Surface and Thin Film Analysis

A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition

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Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

Nákup knihy

Surface and Thin Film Analysis, Gernot Friedbacher, Henning Bubert

Jazyk
Rok vydania
2011
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Titul
Surface and Thin Film Analysis
Podtitul
A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition
Jazyk
anglicky
Vydavateľ
Wiley-VCH
Rok vydania
2011
Väzba
pevná
Počet strán
558
ISBN10
3527320474
ISBN13
9783527320479
Série
Anotácia
Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.