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Parametre
Viac o knihe
This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties.
Nákup knihy
High resolution X-ray scattering from thin films and multilayers, Václav Holý
- Jazyk
- Rok vydania
- 1999
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