Kniha momentálne nie je na sklade
Parametre
Viac o knihe
"Novel Algorithms for Fast Statistical Analysis of Scaled Circuits" addresses the challenges posed by manufacturing imperfections in nanometer-scale VLSI technology. It combines methods from computational finance, machine learning, and actuarial risk to develop innovative solutions for efficient statistical analysis of integrated circuits in this advanced domain.
Nákup knihy
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Amith Singhee, Rob A. Rutenbar
- Jazyk
- Rok vydania
- 2012
- product-detail.submit-box.info.binding
- (mäkká)
Akonáhle sa objaví, pošleme e-mail.
Platobné metódy
Nikto zatiaľ neohodnotil.