Parametre
- 689 stránok
- 25 hodin čítania
Viac o knihe
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Nákup knihy
Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Jazyk
- Rok vydania
- 2003
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- Cena
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- Podtitul
- Third Edition
- Jazyk
- anglicky
- Autori
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Vydavateľ
- Springer
- Rok vydania
- 2003
- Väzba
- pevná
- Počet strán
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Série
- Štítky
- Náučná literatúra, Učebnice, Technológie & Priemysel, Zdravie & Lekárstvo, Veda & Matematika, Príručky a návody, Ostatné učebnice, Štúdium medicíny
- Anotácia
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.